Attachment 30645 Details for Bug 24700 – smartctl -a output

smartctl -a output

smartctl-output.txt (text/plain), 3.94 KB, created by Bastien Nocera on 2009-10-23 10:21:29 UTC

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Creator: Bastien Nocera

Created: 2009-10-23 10:21:29 UTC

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>smartctl version 5.38 [x86_64-redhat-linux-gnu] Copyright (C) 2002-8 Bruce Allen
>Home page is http://smartmontools.sourceforge.net/
>
>=== START OF INFORMATION SECTION ===
>Device Model:     MCCOE64GEMPP
>Serial Number:    SE808N0608
>Firmware Version: 2.9.09
>User Capacity:    60,022,480,896 bytes
>Device is:        Not in smartctl database [for details use: -P showall]
>ATA Version is:   7
>ATA Standard is:  ATA/ATAPI-7 T13 1532D revision 4a
>Local Time is:    Fri Oct 23 18:20:12 2009 BST
>SMART support is: Available - device has SMART capability.
>SMART support is: Enabled
>
>=== START OF READ SMART DATA SECTION ===
>SMART overall-health self-assessment test result: PASSED
>
>General SMART Values:
>Offline data collection status:  (0x02)	Offline data collection activity
>					was completed without error.
>					Auto Offline Data Collection: Disabled.
>Self-test execution status:      (   0)	The previous self-test routine completed
>					without error or no self-test has ever 
>					been run.
>Total time to complete Offline 
>data collection: 		 ( 120) seconds.
>Offline data collection
>capabilities: 			 (0x5b) SMART execute Offline immediate.
>					Auto Offline data collection on/off support.
>					Suspend Offline collection upon new
>					command.
>					Offline surface scan supported.
>					Self-test supported.
>					No Conveyance Self-test supported.
>					Selective Self-test supported.
>SMART capabilities:            (0x0003)	Saves SMART data before entering
>					power-saving mode.
>					Supports SMART auto save timer.
>Error logging capability:        (0x01)	Error logging supported.
>					General Purpose Logging supported.
>Short self-test routine 
>recommended polling time: 	 (   2) minutes.
>Extended self-test routine
>recommended polling time: 	 (  15) minutes.
>
>SMART Attributes Data Structure revision number: 1
>Vendor Specific SMART Attributes with Thresholds:
>ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
>  1 Raw_Read_Error_Rate     0x000f   099   099   051    Pre-fail  Always       -       0
>  5 Reallocated_Sector_Ct   0x0007   085   085   001    Pre-fail  Always       -       2379776
>  9 Power_On_Hours          0x0033   099   099   000    Pre-fail  Always       -       1
> 12 Power_Cycle_Count       0x0033   099   099   000    Pre-fail  Always       -       36
>184 Unknown_Attribute       0x0033   099   099   000    Pre-fail  Always       -       0
>187 Reported_Uncorrect      0x0033   100   100   000    Pre-fail  Always       -       0
>188 Unknown_Attribute       0x0033   099   099   000    Pre-fail  Always       -       0
>190 Airflow_Temperature_Cel 0x0023   045   045   000    Pre-fail  Always       -       0
>195 Hardware_ECC_Recovered  0x001a   200   200   000    Old_age   Always       -       0
>196 Reallocated_Event_Count 0x0033   099   099   000    Pre-fail  Always       -       0
>197 Current_Pending_Sector  0x0012   099   099   000    Old_age   Always       -       0
>198 Offline_Uncorrectable   0x003e   100   100   000    Old_age   Always       -       0
>199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age   Always       -       0
>201 Soft_Read_Error_Rate    0x0032   100   100   002    Old_age   Always       -       0
>202 TA_Increase_Count       0x0032   100   100   002    Old_age   Always       -       0
>232 Unknown_Attribute       0x0013   085   085   002    Pre-fail  Always       -       3451
>
>SMART Error Log Version: 1
>No Errors Logged
>
>SMART Self-test log structure revision number 1
>No self-tests have been logged.  [To run self-tests, use: smartctl -t]
>
>
>SMART Selective self-test log data structure revision number 1
> SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
>    1        0        0  Not_testing
>    2        0        0  Not_testing
>    3        0        0  Not_testing
>    4        0        0  Not_testing
>    5        0        0  Not_testing
>Selective self-test flags (0x0):
>  After scanning selected spans, do NOT read-scan remainder of disk.
>If Selective self-test is pending on power-up, resume after 0 minute delay.
>

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