Attachment 32572 Details for Bug 25993 – smartctl -a output

smartctl -a output

smartctl.txt (text/plain), 4.18 KB, created by drago01 on 2010-01-11 10:21:37 UTC

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Creator: drago01

Created: 2010-01-11 10:21:37 UTC

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>smartctl 5.39 2009-12-09 r2995 [x86_64-redhat-linux-gnu] (local build)
>Copyright (C) 2002-9 by Bruce Allen, http://smartmontools.sourceforge.net
>
>=== START OF INFORMATION SECTION ===
>Device Model:     SAMSUNG MMCRE28G5MXP-0VBH1
>Serial Number:    YCB540G940SY940A3468
>Firmware Version: VBM19C1Q
>User Capacity:    128.035.676.160 bytes
>Device is:        Not in smartctl database [for details use: -P showall]
>ATA Version is:   7
>ATA Standard is:  ATA/ATAPI-7 T13 1532D revision 1
>Local Time is:    Mon Jan 11 19:18:46 2010 CET
>SMART support is: Available - device has SMART capability.
>SMART support is: Enabled
>
>=== START OF READ SMART DATA SECTION ===
>SMART overall-health self-assessment test result: PASSED
>
>General SMART Values:
>Offline data collection status:  (0x00)	Offline data collection activity
>					was never started.
>					Auto Offline Data Collection: Disabled.
>Self-test execution status:      (  25)	The self-test routine was aborted by
>					the host.
>Total time to complete Offline 
>data collection: 		 ( 240) seconds.
>Offline data collection
>capabilities: 			 (0x53) SMART execute Offline immediate.
>					Auto Offline data collection on/off support.
>					Suspend Offline collection upon new
>					command.
>					No Offline surface scan supported.
>					Self-test supported.
>					No Conveyance Self-test supported.
>					Selective Self-test supported.
>SMART capabilities:            (0x0003)	Saves SMART data before entering
>					power-saving mode.
>					Supports SMART auto save timer.
>Error logging capability:        (0x01)	Error logging supported.
>					General Purpose Logging supported.
>Short self-test routine 
>recommended polling time: 	 (   4) minutes.
>Extended self-test routine
>recommended polling time: 	 (  24) minutes.
>
>SMART Attributes Data Structure revision number: 1
>Vendor Specific SMART Attributes with Thresholds:
>ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
>  9 Power_On_Hours          0x0032   099   099   000    Old_age   Always       -       48
> 12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always       -       68
>175 Program_Fail_Count_Chip 0x0032   100   100   010    Old_age   Always       -       0
>176 Erase_Fail_Count_Chip   0x0032   100   100   010    Old_age   Always       -       0
>177 Wear_Leveling_Count     0x0013   099   099   017    Pre-fail  Always       -       1
>178 Used_Rsvd_Blk_Cnt_Chip  0x0013   085   085   010    Pre-fail  Always       -       9
>179 Used_Rsvd_Blk_Cnt_Tot   0x0013   097   097   010    Pre-fail  Always       -       79
>180 Unused_Rsvd_Blk_Cnt_Tot 0x0013   097   097   010    Pre-fail  Always       -       3761
>181 Program_Fail_Cnt_Total  0x0032   100   100   010    Old_age   Always       -       0
>182 Erase_Fail_Count_Total  0x0032   100   100   010    Old_age   Always       -       0
>183 Runtime_Bad_Block       0x0013   100   100   010    Pre-fail  Always       -       0
>187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
>195 Hardware_ECC_Recovered  0x001a   200   200   000    Old_age   Always       -       0
>198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
>199 UDMA_CRC_Error_Count    0x003e   253   253   000    Old_age   Always       -       0
>232 Available_Reservd_Space 0x0013   085   085   010    Pre-fail  Always       -       51
>233 Media_Wearout_Indicator 0x0032   099   099   000    Old_age   Always       -       5793
>
>SMART Error Log Version: 1
>No Errors Logged
>
>SMART Self-test log structure revision number 1
>Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
># 1  Extended offline    Aborted by host               90%         0         -
># 2  Short offline       Completed without error       00%         0         -
>
>SMART Selective self-test log data structure revision number 1
> SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
>    1        0        0  Not_testing
>    2        0        0  Not_testing
>    3        0        0  Not_testing
>    4        0        0  Not_testing
>    5        0        0  Not_testing
>Selective self-test flags (0x0):
>  After scanning selected spans, do NOT read-scan remainder of disk.
>If Selective self-test is pending on power-up, resume after 0 minute delay.
>

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