Attachment 140107 Details for Bug 106869 – sudo fwts method > fwts_method

sudo fwts method > fwts_method

fwts_method.results.log (text/x-log), 50.44 KB, created by victor on 2018-06-09 11:38:08 UTC

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Creator: victor

Created: 2018-06-09 11:38:08 UTC

Size: 50.44 KB

patch

obsolete

>Results generated by fwts: Version V18.03.00 (2018-03-21 07:09:58).
>
>Some of this work - Copyright (c) 1999 - 2018, Intel Corp. All rights reserved.
>Some of this work - Copyright (c) 2010 - 2018, Canonical.
>Some of this work - Copyright (c) 2016 - 2018, IBM.
>Some of this work - Copyright (c) 2017 - 2018, ARM Ltd.
>
>This test run on 09/06/18 at 13:30:19 on host Linux victor-MacBookAir
>4.15.0-20-generic #21-Ubuntu SMP Tue Apr 24 06:16:15 UTC 2018 x86_64.
>
>Command: "fwts method".
>Running tests: method.
>
>method: ACPI DSDT Method Semantic tests.
>--------------------------------------------------------------------------------
>Test 1 of 194: Test Method Names.
>Found 1153 Objects 
>PASSED: Test 1, Method names contain legal characters.
>
>Test 2 of 194: Test _AEI.
>SKIPPED: Test 2, Skipping test for non-existent object _AEI.
>
>Test 3 of 194: Test _EVT (Event Method).
>SKIPPED: Test 3, Skipping test for non-existent object _EVT.
>
>Test 4 of 194: Test _DLM (Device Lock Mutex).
>SKIPPED: Test 4, Skipping test for non-existent object _DLM.
>
>Test 5 of 194: Test _PIC (Inform AML of Interrupt Model).
>PASSED: Test 5, \_PIC returned no values as expected.
>PASSED: Test 5, \_PIC returned no values as expected.
>PASSED: Test 5, \_PIC returned no values as expected.
>
>Test 6 of 194: Test _CID (Compatible ID).
>FAILED [MEDIUM] MethodCIDInvalidString: Test 6, \_SB_.PNLF._CID returned a
>string 'BACKLIGHT' but it was not a valid PNP ID or a valid ACPI ID.
>PASSED: Test 6, \_SB_.PCI0._CID returned an integer 0x030ad041 (EISA ID
>PNP0A03).
>FAILED [MEDIUM] MethodCIDInvalidString: Test 6, \_SB_.PCI0.LPCB.SMC_._CID
>returned a string 'SMC-MCP' but it was not a valid PNP ID or a valid ACPI ID.
>PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._CID returned an integer 0x010cd041 (EISA
>ID PNP0C01).
>FAILED [MEDIUM] MethodCIDInvalidString: Test 6, \_SB_.PCI0.SBUS.BUS0._CID
>returned a string 'SMBUS' but it was not a valid PNP ID or a valid ACPI ID.
>FAILED [MEDIUM] MethodCIDInvalidString: Test 6, \_SB_.PCI0.SBUS.BUS0.MKY0._CID
>returned a string 'MIKEY' but it was not a valid PNP ID or a valid ACPI ID.
>FAILED [MEDIUM] MethodCIDInvalidString: Test 6, \_SB_.PCI0.SBUS.BUS1._CID
>returned a string 'SMBUS' but it was not a valid PNP ID or a valid ACPI ID.
>
>Test 7 of 194: Test _DDN (DOS Device Name).
>SKIPPED: Test 7, Skipping test for non-existent object _DDN.
>
>Test 8 of 194: Test _HID (Hardware ID).
>PASSED: Test 8, \_SB_.ADP1._HID returned a string 'ACPI0003' as expected.
>PASSED: Test 8, \_SB_.LID0._HID returned an integer 0x0d0cd041 (EISA ID
>PNP0C0D).
>PASSED: Test 8, \_SB_.PNLF._HID returned an integer 0x02001006 (EISA ID
>APP0002).
>PASSED: Test 8, \_SB_.PWRB._HID returned an integer 0x0c0cd041 (EISA ID
>PNP0C0C).
>PASSED: Test 8, \_SB_.SLPB._HID returned an integer 0x0e0cd041 (EISA ID
>PNP0C0E).
>PASSED: Test 8, \_SB_.PCI0._HID returned an integer 0x080ad041 (EISA ID
>PNP0A08).
>PASSED: Test 8, \_SB_.PCI0.PDRC._HID returned an integer 0x020cd041 (EISA ID
>PNP0C02).
>PASSED: Test 8, \_SB_.PCI0.LPCB.SMC_._HID returned an integer 0x01001006 (EISA
>ID APP0001).
>PASSED: Test 8, \_SB_.PCI0.LPCB.EC__._HID returned an integer 0x090cd041 (EISA
>ID PNP0C09).
>PASSED: Test 8, \_SB_.PCI0.LPCB.EC__.SMB0._HID returned a string 'ACPI0001' as
>expected.
>PASSED: Test 8, \_SB_.PCI0.LPCB.EC__.SMB0.SBS0._HID returned a string 'ACPI0002'
>as expected.
>PASSED: Test 8, \_SB_.PCI0.LPCB.DMAC._HID returned an integer 0x0002d041 (EISA
>ID PNP0200).
>PASSED: Test 8, \_SB_.PCI0.LPCB.HPET._HID returned an integer 0x0301d041 (EISA
>ID PNP0103).
>PASSED: Test 8, \_SB_.PCI0.LPCB.IPIC._HID returned an integer 0x0000d041 (EISA
>ID PNP0000).
>PASSED: Test 8, \_SB_.PCI0.LPCB.MATH._HID returned an integer 0x040cd041 (EISA
>ID PNP0C04).
>PASSED: Test 8, \_SB_.PCI0.LPCB.LDRC._HID returned an integer 0x020cd041 (EISA
>ID PNP0C02).
>PASSED: Test 8, \_SB_.PCI0.LPCB.RTC_._HID returned an integer 0x000bd041 (EISA
>ID PNP0B00).
>PASSED: Test 8, \_SB_.PCI0.LPCB.TIMR._HID returned an integer 0x0001d041 (EISA
>ID PNP0100).
>PASSED: Test 8, \_SB_.PCI0.LNK1._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.LNK2._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.LNK3._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.LNK4._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.Z00J._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.Z00K._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.Z00L._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.Z00M._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.LSMB._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.LUS0._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.LUS2._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.LMAC._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.LAZA._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.LGPU._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.LPID._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.LSI0._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.Z000._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.Z001._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.PCI0.LPMU._HID returned an integer 0x0f0cd041 (EISA ID
>PNP0C0F).
>PASSED: Test 8, \_SB_.BAT0._HID returned an integer 0x0a0cd041 (EISA ID
>PNP0C0A).
>
>Test 9 of 194: Test _HRV (Hardware Revision Number).
>SKIPPED: Test 9, Skipping test for non-existent object _HRV.
>
>Test 10 of 194: Test _MLS (Multiple Language String).
>SKIPPED: Test 10, Skipping test for non-existent object _MLS.
>
>Test 11 of 194: Test _PLD (Physical Device Location).
>PASSED: Test 11, \_SB_.PCI0.OHC1.HUB1.PRT1._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.OHC1.HUB1.PRT2._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.OHC1.HUB1.PRT3._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.OHC1.HUB1.PRT4._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.OHC1.HUB1.PRT5._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.OHC1.HUB1.PRT6._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.EHC1.HUB1.PRT1._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.EHC1.HUB1.PRT2._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.EHC1.HUB1.PRT3._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.EHC1.HUB1.PRT4._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.EHC1.HUB1.PRT5._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.EHC1.HUB1.PRT6._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.OHC2.HUB1.PRT2._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.OHC2.HUB1.PRT3._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.OHC2.HUB1.PRT4._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.OHC2.HUB1.PRT5._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.OHC2.HUB1.PRT6._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.OHC2.HUB1.PRT1._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.EHC2.HUB1.PRT2._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.EHC2.HUB1.PRT3._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.EHC2.HUB1.PRT4._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.EHC2.HUB1.PRT5._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.EHC2.HUB1.PRT6._PLD correctly returned a sane
>looking package.
>PASSED: Test 11, \_SB_.PCI0.EHC2.HUB1.PRT1._PLD correctly returned a sane
>looking package.
>
>Test 12 of 194: Test _SUB (Subsystem ID).
>SKIPPED: Test 12, Skipping test for non-existent object _SUB.
>
>Test 13 of 194: Test _SUN (Slot User Number).
>SKIPPED: Test 13, Skipping test for non-existent object _SUN.
>
>Test 14 of 194: Test _STR (String).
>SKIPPED: Test 14, Skipping test for non-existent object _STR.
>
>Test 15 of 194: Test _UID (Unique ID).
>PASSED: Test 15, \_SB_.PNLF._UID correctly returned sane looking value
>0x0000000a.
>PASSED: Test 15, \_SB_.PCI0.PDRC._UID correctly returned sane looking value
>0x00000001.
>PASSED: Test 15, \_SB_.PCI0.LPCB.EC__._UID correctly returned sane looking value
>0x00000000.
>PASSED: Test 15, \_SB_.PCI0.LPCB.LDRC._UID correctly returned sane looking value
>0x00000002.
>PASSED: Test 15, \_SB_.PCI0.LNK1._UID correctly returned sane looking value
>0x00000001.
>PASSED: Test 15, \_SB_.PCI0.LNK2._UID correctly returned sane looking value
>0x00000002.
>PASSED: Test 15, \_SB_.PCI0.LNK3._UID correctly returned sane looking value
>0x00000003.
>PASSED: Test 15, \_SB_.PCI0.LNK4._UID correctly returned sane looking value
>0x00000004.
>PASSED: Test 15, \_SB_.PCI0.Z00J._UID correctly returned sane looking value
>0x00000015.
>PASSED: Test 15, \_SB_.PCI0.Z00K._UID correctly returned sane looking value
>0x00000016.
>PASSED: Test 15, \_SB_.PCI0.Z00L._UID correctly returned sane looking value
>0x00000017.
>PASSED: Test 15, \_SB_.PCI0.Z00M._UID correctly returned sane looking value
>0x00000018.
>PASSED: Test 15, \_SB_.PCI0.LSMB._UID correctly returned sane looking value
>0x00000025.
>PASSED: Test 15, \_SB_.PCI0.LUS0._UID correctly returned sane looking value
>0x00000026.
>PASSED: Test 15, \_SB_.PCI0.LUS2._UID correctly returned sane looking value
>0x00000027.
>PASSED: Test 15, \_SB_.PCI0.LMAC._UID correctly returned sane looking value
>0x00000028.
>PASSED: Test 15, \_SB_.PCI0.LAZA._UID correctly returned sane looking value
>0x00000029.
>PASSED: Test 15, \_SB_.PCI0.LGPU._UID correctly returned sane looking value
>0x0000002a.
>PASSED: Test 15, \_SB_.PCI0.LPID._UID correctly returned sane looking value
>0x0000002b.
>PASSED: Test 15, \_SB_.PCI0.LSI0._UID correctly returned sane looking value
>0x0000002c.
>PASSED: Test 15, \_SB_.PCI0.Z000._UID correctly returned sane looking value
>0x0000002e.
>PASSED: Test 15, \_SB_.PCI0.Z001._UID correctly returned sane looking value
>0x0000002f.
>PASSED: Test 15, \_SB_.PCI0.LPMU._UID correctly returned sane looking value
>0x00000030.
>PASSED: Test 15, \_SB_.BAT0._UID correctly returned sane looking value
>0x00000000.
>
>Test 16 of 194: Test _CDM (Clock Domain).
>SKIPPED: Test 16, Skipping test for non-existent object _CDM.
>
>Test 17 of 194: Test _CRS (Current Resource Settings).
>PASSED: Test 17, \_SB_.PCI0._CRS (WORD Address Space Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.PDRC._CRS (32-bit Fixed Location Memory Range
>Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LPCB.SMC_._CRS (I/O Port Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LPCB.EC__._CRS (I/O Port Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LPCB.DMAC._CRS (I/O Port Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LPCB.HPET._CRS (End Tag Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LPCB.IPIC._CRS (I/O Port Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LPCB.MATH._CRS (I/O Port Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LPCB.LDRC._CRS (I/O Port Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LPCB.RTC_._CRS (I/O Port Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LPCB.TIMR._CRS (I/O Port Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LNK1._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LNK2._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LNK3._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LNK4._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.Z00J._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.Z00K._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.Z00L._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.Z00M._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LSMB._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LUS0._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LUS2._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LMAC._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LAZA._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LGPU._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LPID._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LSI0._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.Z000._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.Z001._CRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 17, \_SB_.PCI0.LPMU._CRS (Extended IRQ Descriptor) looks sane.
>
>Test 18 of 194: Test _DSD (Device Specific Data).
>SKIPPED: Test 18, Skipping test for non-existent object _DSD.
>
>Test 19 of 194: Test _DIS (Disable).
>PASSED: Test 19, \_SB_.PCI0.LNK1._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.LNK2._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.LNK3._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.LNK4._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.Z00J._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.Z00K._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.Z00L._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.Z00M._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.LSMB._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.LUS0._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.LUS2._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.LMAC._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.LAZA._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.LGPU._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.LPID._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.LSI0._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.Z000._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.Z001._DIS returned no values as expected.
>PASSED: Test 19, \_SB_.PCI0.LPMU._DIS returned no values as expected.
>
>Test 20 of 194: Test _DMA (Direct Memory Access).
>SKIPPED: Test 20, Skipping test for non-existent object _DMA.
>
>Test 21 of 194: Test _FIX (Fixed Register Resource Provider).
>SKIPPED: Test 21, Skipping test for non-existent object _FIX.
>
>Test 22 of 194: Test _GSB (Global System Interrupt Base).
>SKIPPED: Test 22, Skipping test for non-existent object _GSB.
>
>Test 23 of 194: Test _HPP (Hot Plug Parameters).
>SKIPPED: Test 23, Skipping test for non-existent object _HPP.
>
>Test 24 of 194: Test _PRS (Possible Resource Settings).
>PASSED: Test 24, \_SB_.PCI0.LNK1._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.LNK2._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.LNK3._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.LNK4._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.Z00J._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.Z00K._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.Z00L._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.Z00M._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.LSMB._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.LUS0._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.LUS2._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.LMAC._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.LAZA._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.LGPU._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.LPID._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.LSI0._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.Z000._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.Z001._PRS (Extended IRQ Descriptor) looks sane.
>PASSED: Test 24, \_SB_.PCI0.LPMU._PRS (Extended IRQ Descriptor) looks sane.
>
>Test 25 of 194: Test _PRT (PCI Routing Table).
>PASSED: Test 25, \_SB_.PCI0._PRT correctly returned a sane looking package.
>PASSED: Test 25, \_SB_.PCI0.IXVE._PRT correctly returned a sane looking package.
>
>Test 26 of 194: Test _PXM (Proximity).
>SKIPPED: Test 26, Skipping test for non-existent object _PXM.
>
>Test 27 of 194: Test _CCA (Cache Coherency Attribute).
>SKIPPED: Test 27, Skipping test for non-existent object _CCA.
>
>Test 28 of 194: Test _EDL (Eject Device List).
>SKIPPED: Test 28, Skipping test for non-existent object _EDL.
>
>Test 29 of 194: Test _EJD (Ejection Dependent Device).
>SKIPPED: Test 29, Skipping test for non-existent object _EJD.
>
>Test 30 of 194: Test _EJ0 (Eject).
>SKIPPED: Test 30, Skipping test for non-existent object _EJ0.
>
>Test 31 of 194: Test _EJ1 (Eject).
>SKIPPED: Test 31, Skipping test for non-existent object _EJ1.
>
>Test 32 of 194: Test _EJ2 (Eject).
>SKIPPED: Test 32, Skipping test for non-existent object _EJ2.
>
>Test 33 of 194: Test _EJ3 (Eject).
>SKIPPED: Test 33, Skipping test for non-existent object _EJ3.
>
>Test 34 of 194: Test _EJ4 (Eject).
>SKIPPED: Test 34, Skipping test for non-existent object _EJ4.
>
>Test 35 of 194: Test _LCK (Lock).
>SKIPPED: Test 35, Skipping test for non-existent object _LCK.
>
>Test 36 of 194: Test _RMV (Remove).
>PASSED: Test 36, \_SB_.PCI0.OHC1.HUB1.PRT2._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.OHC1.HUB1.PRT3._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.OHC1.HUB1.PRT5._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.OHC1.HUB1.PRT6._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.EHC1.HUB1.PRT2._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.EHC1.HUB1.PRT3._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.EHC1.HUB1.PRT5._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.EHC1.HUB1.PRT6._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.OHC2.HUB1.PRT3._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.OHC2.HUB1.PRT5._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.OHC2.HUB1.PRT6._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.OHC2.HUB1.PRT1._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.EHC2.HUB1.PRT3._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.EHC2.HUB1.PRT5._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.EHC2.HUB1.PRT6._RMV correctly returned sane looking
>value 0x00000000.
>PASSED: Test 36, \_SB_.PCI0.EHC2.HUB1.PRT1._RMV correctly returned sane looking
>value 0x00000000.
>
>Test 37 of 194: Test _STA (Status).
>PASSED: Test 37, \_SB_.PNLF._STA correctly returned sane looking value
>0x0000000b.
>PASSED: Test 37, \_SB_.SLPB._STA correctly returned sane looking value
>0x0000000b.
>PASSED: Test 37, \_SB_.PCI0._STA correctly returned sane looking value
>0x0000000f.
>PASSED: Test 37, \_SB_.PCI0.LPCB.SMC_._STA correctly returned sane looking value
>0x0000000b.
>PASSED: Test 37, \_SB_.PCI0.LPCB.EC__.SMB0._STA correctly returned sane looking
>value 0x00000000.
>PASSED: Test 37, \_SB_.PCI0.LPCB.HPET._STA correctly returned sane looking value
>0x00000000.
>PASSED: Test 37, \_SB_.PCI0.LNK1._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.LNK2._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.LNK3._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.LNK4._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.Z00J._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.Z00K._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.Z00L._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.Z00M._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.LSMB._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.LUS0._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.LUS2._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.LMAC._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.LAZA._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.LGPU._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.LPID._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.LSI0._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.Z000._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.Z001._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.LPMU._STA correctly returned sane looking value
>0x00000009.
>PASSED: Test 37, \_SB_.PCI0.IXVE._STA correctly returned sane looking value
>0x0000000f.
>PASSED: Test 37, \_SB_.PCI0.RP05._STA correctly returned sane looking value
>0x0000000f.
>PASSED: Test 37, \_SB_.BAT0._STA correctly returned sane looking value
>0x0000000f.
>
>Test 38 of 194: Test _DEP (Operational Region Dependencies).
>SKIPPED: Test 38, Skipping test for non-existent object _DEP.
>
>Test 39 of 194: Test _FIT (Firmware Interface Table).
>SKIPPED: Test 39, Skipping test for non-existent object _FIT.
>
>Test 40 of 194: Test _BDN (BIOS Dock Name).
>SKIPPED: Test 40, Skipping test for non-existent object _BDN.
>
>Test 41 of 194: Test _BBN (Base Bus Number).
>PASSED: Test 41, \_SB_.PCI0._BBN correctly returned an integer.
>PASSED: Test 41, \_SB_.PCI0.IXVE._BBN correctly returned an integer.
>PASSED: Test 41, \_SB_.PCI0.RP05._BBN correctly returned an integer.
>
>Test 42 of 194: Test _DCK (Dock).
>SKIPPED: Test 42, Skipping test for non-existent object _DCK.
>
>Test 43 of 194: Test _INI (Initialize).
>PASSED: Test 43, \_SB_._INI returned no values as expected.
>PASSED: Test 43, \_SB_.PCI0._INI returned no values as expected.
>
>Test 44 of 194: Test _GLK (Global Lock).
>SKIPPED: Test 44, Skipping test for non-existent object _GLK.
>
>Test 45 of 194: Test _SEG (Segment).
>SKIPPED: Test 45, Skipping test for non-existent object _SEG.
>
>Test 46 of 194: Test _LSI (Label Storage Information).
>SKIPPED: Test 46, Skipping test for non-existent object _LSI.
>
>Test 47 of 194: Test _OFF (Set resource off).
>SKIPPED: Test 47, Skipping test for non-existent object _OFF.
>
>Test 48 of 194: Test _ON_ (Set resource on).
>SKIPPED: Test 48, Skipping test for non-existent object _ON_.
>
>Test 49 of 194: Test _DSW (Device Sleep Wake).
>SKIPPED: Test 49, Skipping test for non-existent object _DSW.
>
>Test 50 of 194: Test _IRC (In Rush Current).
>SKIPPED: Test 50, Skipping test for non-existent object _IRC.
>
>Test 51 of 194: Test _PRE (Power Resources for Enumeration).
>SKIPPED: Test 51, Skipping test for non-existent object _PRE.
>
>Test 52 of 194: Test _PR0 (Power Resources for D0).
>SKIPPED: Test 52, Skipping test for non-existent object _PR0.
>
>Test 53 of 194: Test _PR1 (Power Resources for D1).
>SKIPPED: Test 53, Skipping test for non-existent object _PR1.
>
>Test 54 of 194: Test _PR2 (Power Resources for D2).
>SKIPPED: Test 54, Skipping test for non-existent object _PR2.
>
>Test 55 of 194: Test _PR3 (Power Resources for D3).
>SKIPPED: Test 55, Skipping test for non-existent object _PR3.
>
>Test 56 of 194: Test _PRW (Power Resources for Wake).
>PASSED: Test 56, \_SB_.ADP1._PRW correctly returned a sane looking package.
>PASSED: Test 56, \_SB_.LID0._PRW correctly returned a sane looking package.
>PASSED: Test 56, \_SB_.PCI0.LPCB.EC__._PRW correctly returned a sane looking
>package.
>PASSED: Test 56, \_SB_.PCI0.OHC1._PRW correctly returned a sane looking package.
>PASSED: Test 56, \_SB_.PCI0.EHC1._PRW correctly returned a sane looking package.
>PASSED: Test 56, \_SB_.PCI0.OHC2._PRW correctly returned a sane looking package.
>PASSED: Test 56, \_SB_.PCI0.EHC2._PRW correctly returned a sane looking package.
>PASSED: Test 56, \_SB_.PCI0.RP05.ARPT._PRW correctly returned a sane looking
>package.
>
>Test 57 of 194: Test _PS0 (Power State 0).
>PASSED: Test 57, \_SB_.PCI0.OHC1._PS0 returned no values as expected.
>PASSED: Test 57, \_SB_.PCI0.EHC1._PS0 returned no values as expected.
>PASSED: Test 57, \_SB_.PCI0.OHC2._PS0 returned no values as expected.
>PASSED: Test 57, \_SB_.PCI0.EHC2._PS0 returned no values as expected.
>PASSED: Test 57, \_SB_.PCI0.HDEF._PS0 returned no values as expected.
>PASSED: Test 57, \_SB_.PCI0.SATA._PS0 returned no values as expected.
>PASSED: Test 57, \_SB_.PCI0.RP05._PS0 returned no values as expected.
>
>Test 58 of 194: Test _PS1 (Power State 1).
>SKIPPED: Test 58, Skipping test for non-existent object _PS1.
>
>Test 59 of 194: Test _PS2 (Power State 2).
>SKIPPED: Test 59, Skipping test for non-existent object _PS2.
>
>Test 60 of 194: Test _PS3 (Power State 3).
>PASSED: Test 60, \_SB_.PCI0.OHC1._PS3 returned no values as expected.
>PASSED: Test 60, \_SB_.PCI0.EHC1._PS3 returned no values as expected.
>PASSED: Test 60, \_SB_.PCI0.OHC2._PS3 returned no values as expected.
>PASSED: Test 60, \_SB_.PCI0.EHC2._PS3 returned no values as expected.
>PASSED: Test 60, \_SB_.PCI0.HDEF._PS3 returned no values as expected.
>PASSED: Test 60, \_SB_.PCI0.SATA._PS3 returned no values as expected.
>PASSED: Test 60, \_SB_.PCI0.RP05._PS3 returned no values as expected.
>
>Test 61 of 194: Test _PSC (Power State Current).
>SKIPPED: Test 61, Skipping test for non-existent object _PSC.
>
>Test 62 of 194: Test _PSE (Power State for Enumeration).
>SKIPPED: Test 62, Skipping test for non-existent object _PSE.
>
>Test 63 of 194: Test _PSW (Power State Wake).
>PASSED: Test 63, \_SB_.ADP1._PSW returned no values as expected.
>PASSED: Test 63, \_SB_.LID0._PSW returned no values as expected.
>
>Test 64 of 194: Test _S1D (S1 Device State).
>SKIPPED: Test 64, Skipping test for non-existent object _S1D.
>
>Test 65 of 194: Test _S2D (S2 Device State).
>SKIPPED: Test 65, Skipping test for non-existent object _S2D.
>
>Test 66 of 194: Test _S3D (S3 Device State).
>PASSED: Test 66, \_SB_.PCI0._S3D correctly returned an integer.
>PASSED: Test 66, \_SB_.PCI0.OHC1._S3D correctly returned an integer.
>PASSED: Test 66, \_SB_.PCI0.EHC1._S3D correctly returned an integer.
>PASSED: Test 66, \_SB_.PCI0.OHC2._S3D correctly returned an integer.
>PASSED: Test 66, \_SB_.PCI0.EHC2._S3D correctly returned an integer.
>
>Test 67 of 194: Test _S4D (S4 Device State).
>PASSED: Test 67, \_SB_.PCI0._S4D correctly returned an integer.
>PASSED: Test 67, \_SB_.PCI0.OHC1._S4D correctly returned an integer.
>PASSED: Test 67, \_SB_.PCI0.EHC1._S4D correctly returned an integer.
>PASSED: Test 67, \_SB_.PCI0.OHC2._S4D correctly returned an integer.
>PASSED: Test 67, \_SB_.PCI0.EHC2._S4D correctly returned an integer.
>
>Test 68 of 194: Test _S0W (S0 Device Wake State).
>SKIPPED: Test 68, Skipping test for non-existent object _S0W.
>
>Test 69 of 194: Test _S1W (S1 Device Wake State).
>SKIPPED: Test 69, Skipping test for non-existent object _S1W.
>
>Test 70 of 194: Test _S2W (S2 Device Wake State).
>SKIPPED: Test 70, Skipping test for non-existent object _S2W.
>
>Test 71 of 194: Test _S3W (S3 Device Wake State).
>SKIPPED: Test 71, Skipping test for non-existent object _S3W.
>
>Test 72 of 194: Test _S4W (S4 Device Wake State).
>SKIPPED: Test 72, Skipping test for non-existent object _S4W.
>
>Test 73 of 194: Test _RST (Device Reset).
>SKIPPED: Test 73, Skipping test for non-existent object _RST.
>
>Test 74 of 194: Test _PRR (Power Resource for Reset).
>SKIPPED: Test 74, Skipping test for non-existent object _PRR.
>
>Test 75 of 194: Test _S0_ (S0 System State).
>\_S0_ PM1a_CNT.SLP_TYP value: 0x00000000
>\_S0_ PM1b_CNT.SLP_TYP value: 0x00000000
>PASSED: Test 75, \_S0_ correctly returned a sane looking package.
>
>Test 76 of 194: Test _S1_ (S1 System State).
>SKIPPED: Test 76, Skipping test for non-existent object _S1_.
>
>Test 77 of 194: Test _S2_ (S2 System State).
>SKIPPED: Test 77, Skipping test for non-existent object _S2_.
>
>Test 78 of 194: Test _S3_ (S3 System State).
>\_S3_ PM1a_CNT.SLP_TYP value: 0x00000005
>\_S3_ PM1b_CNT.SLP_TYP value: 0x00000005
>PASSED: Test 78, \_S3_ correctly returned a sane looking package.
>
>Test 79 of 194: Test _S4_ (S4 System State).
>\_S4_ PM1a_CNT.SLP_TYP value: 0x00000006
>\_S4_ PM1b_CNT.SLP_TYP value: 0x00000006
>PASSED: Test 79, \_S4_ correctly returned a sane looking package.
>
>Test 80 of 194: Test _S5_ (S5 System State).
>\_S5_ PM1a_CNT.SLP_TYP value: 0x00000007
>\_S5_ PM1b_CNT.SLP_TYP value: 0x00000007
>PASSED: Test 80, \_S5_ correctly returned a sane looking package.
>
>Test 81 of 194: Test _SWS (System Wake Source).
>SKIPPED: Test 81, Skipping test for non-existent object _SWS.
>
>Test 82 of 194: Test _PSS (Performance Supported States).
>SKIPPED: Test 82, Skipping test for non-existent object _PSS.
>
>Test 83 of 194: Test _CPC (Continuous Performance Control).
>SKIPPED: Test 83, Skipping test for non-existent object _CPC.
>
>Test 84 of 194: Test _CSD (C State Dependencies).
>SKIPPED: Test 84, Skipping test for non-existent object _CSD.
>
>Test 85 of 194: Test _CST (C States).
>SKIPPED: Test 85, Skipping test for non-existent object _CST.
>
>Test 86 of 194: Test _PCT (Performance Control).
>SKIPPED: Test 86, Skipping test for non-existent object _PCT.
>
>Test 87 of 194: Test _PDL (P-State Depth Limit).
>SKIPPED: Test 87, Skipping test for non-existent object _PDL.
>
>Test 88 of 194: Test _PPC (Performance Present Capabilities).
>SKIPPED: Test 88, Skipping test for non-existent object _PPC.
>
>Test 89 of 194: Test _PPE (Polling for Platform Error).
>SKIPPED: Test 89, Skipping test for non-existent object _PPE.
>
>Test 90 of 194: Test _PSD (Power State Dependencies).
>SKIPPED: Test 90, Skipping test for non-existent object _PSD.
>
>Test 91 of 194: Test _PTC (Processor Throttling Control).
>SKIPPED: Test 91, Skipping test for non-existent object _PTC.
>
>Test 92 of 194: Test _TDL (T-State Depth Limit).
>SKIPPED: Test 92, Skipping test for non-existent object _TDL.
>
>Test 93 of 194: Test _TPC (Throttling Present Capabilities).
>SKIPPED: Test 93, Skipping test for non-existent object _TPC.
>
>Test 94 of 194: Test _TSD (Throttling State Dependencies).
>SKIPPED: Test 94, Skipping test for non-existent object _TSD.
>
>Test 95 of 194: Test _TSS (Throttling Supported States).
>SKIPPED: Test 95, Skipping test for non-existent object _TSS.
>
>Test 96 of 194: Test _LPI (Low Power Idle States).
>SKIPPED: Test 96, Skipping test for non-existent object _LPI.
>
>Test 97 of 194: Test _RDI (Resource Dependencies for Idle).
>SKIPPED: Test 97, Skipping test for non-existent object _RDI.
>
>Test 98 of 194: Test _PUR (Processor Utilization Request).
>SKIPPED: Test 98, Skipping test for non-existent object _PUR.
>
>Test 99 of 194: Test _MSG (Message).
>SKIPPED: Test 99, Skipping test for non-existent object _MSG.
>
>Test 100 of 194: Test _SST (System Status).
>SKIPPED: Test 100, Skipping test for non-existent object _SST.
>
>Test 101 of 194: Test _ALC (Ambient Light Colour Chromaticity).
>SKIPPED: Test 101, Skipping test for non-existent object _ALC.
>
>Test 102 of 194: Test _ALI (Ambient Light Illuminance).
>SKIPPED: Test 102, Skipping test for non-existent object _ALI.
>
>Test 103 of 194: Test _ALT (Ambient Light Temperature).
>SKIPPED: Test 103, Skipping test for non-existent object _ALT.
>
>Test 104 of 194: Test _ALP (Ambient Light Polling).
>SKIPPED: Test 104, Skipping test for non-existent object _ALP.
>
>Test 105 of 194: Test _ALR (Ambient Light Response).
>SKIPPED: Test 105, Skipping test for non-existent object _ALR.
>
>Test 106 of 194: Test _LID (Lid Status).
>PASSED: Test 106, \_SB_.LID0._LID correctly returned sane looking value
>0x00000000.
>
>Test 107 of 194: Test _GTF (Get Task File).
>PASSED: Test 107, \_SB_.PCI0.SATA.PRT0._GTF correctly returned a sane looking
>buffer.
>
>Test 108 of 194: Test _GTM (Get Timing Mode).
>SKIPPED: Test 108, Skipping test for non-existent object _GTM.
>
>Test 109 of 194: Test _MBM (Memory Bandwidth Monitoring Data).
>SKIPPED: Test 109, Skipping test for non-existent object _MBM.
>
>Test 110 of 194: Test _UPC (USB Port Capabilities).
>PASSED: Test 110, \_SB_.PCI0.OHC1.HUB1.PRT1._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.OHC1.HUB1.PRT2._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.OHC1.HUB1.PRT3._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.OHC1.HUB1.PRT4._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.OHC1.HUB1.PRT5._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.OHC1.HUB1.PRT6._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.EHC1.HUB1.PRT1._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.EHC1.HUB1.PRT2._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.EHC1.HUB1.PRT3._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.EHC1.HUB1.PRT4._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.EHC1.HUB1.PRT5._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.EHC1.HUB1.PRT6._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.OHC2.HUB1.PRT2._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.OHC2.HUB1.PRT3._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.OHC2.HUB1.PRT4._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.OHC2.HUB1.PRT5._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.OHC2.HUB1.PRT6._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.OHC2.HUB1.PRT1._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.EHC2.HUB1.PRT2._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.EHC2.HUB1.PRT3._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.EHC2.HUB1.PRT4._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.EHC2.HUB1.PRT5._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.EHC2.HUB1.PRT6._UPC correctly returned a sane
>looking package.
>PASSED: Test 110, \_SB_.PCI0.EHC2.HUB1.PRT1._UPC correctly returned a sane
>looking package.
>
>Test 111 of 194: Test _UPD (User Presence Detect).
>SKIPPED: Test 111, Skipping test for non-existent object _UPD.
>
>Test 112 of 194: Test _UPP (User Presence Polling).
>SKIPPED: Test 112, Skipping test for non-existent object _UPP.
>
>Test 113 of 194: Test _GCP (Get Capabilities).
>SKIPPED: Test 113, Skipping test for non-existent object _GCP.
>
>Test 114 of 194: Test _GRT (Get Real Time).
>SKIPPED: Test 114, Skipping test for non-existent object _GRT.
>
>Test 115 of 194: Test _GWS (Get Wake Status).
>SKIPPED: Test 115, Skipping test for non-existent object _GWS.
>
>Test 116 of 194: Test _CWS (Clear Wake Status).
>SKIPPED: Test 116, Skipping test for non-existent object _CWS.
>
>Test 117 of 194: Test _SRT (Set Real Time).
>SKIPPED: Test 117, Skipping test for non-existent object _SRT.
>
>Test 118 of 194: Test _STP (Set Expired Timer Wake Policy).
>SKIPPED: Test 118, Skipping test for non-existent object _STP.
>
>Test 119 of 194: Test _STV (Set Timer Value).
>SKIPPED: Test 119, Skipping test for non-existent object _STV.
>
>Test 120 of 194: Test _TIP (Expired Timer Wake Policy).
>SKIPPED: Test 120, Skipping test for non-existent object _TIP.
>
>Test 121 of 194: Test _TIV (Timer Values).
>SKIPPED: Test 121, Skipping test for non-existent object _TIV.
>
>Test 122 of 194: Test _SBS (Smart Battery Subsystem).
>PASSED: Test 122, \_SB_.PCI0.LPCB.EC__.SMB0.SBS0._SBS correctly returned value 1
>Maximum 1 Smart Battery, system manager/selector present
>
>Test 123 of 194: Test _BCT (Battery Charge Time).
>SKIPPED: Test 123, Skipping test for non-existent object _BCT.
>
>Test 124 of 194: Test _BIF (Battery Information).
>PASSED: Test 124, \_SB_.BAT0._BIF correctly returned a sane looking package.
>
>Test 125 of 194: Test _BIX (Battery Information Extended).
>SKIPPED: Test 125, Skipping test for non-existent object _BIX.
>
>Test 126 of 194: Test _BMA (Battery Measurement Averaging).
>SKIPPED: Test 126, Skipping test for non-existent object _BMA.
>
>Test 127 of 194: Test _BMC (Battery Maintenance Control).
>SKIPPED: Test 127, Skipping test for non-existent object _BMC.
>
>Test 128 of 194: Test _BMD (Battery Maintenance Data).
>SKIPPED: Test 128, Skipping test for non-existent object _BMD.
>
>Test 129 of 194: Test _BMS (Battery Measurement Sampling Time).
>SKIPPED: Test 129, Skipping test for non-existent object _BMS.
>
>Test 130 of 194: Test _BST (Battery Status).
>PASSED: Test 130, \_SB_.BAT0._BST correctly returned a sane looking package.
>
>Test 131 of 194: Test _BTP (Battery Trip Point).
>SKIPPED: Test 131, Skipping test for non-existent object _BTP.
>
>Test 132 of 194: Test _BTH (Battery Throttle Limit).
>SKIPPED: Test 132, Skipping test for non-existent object _BTH.
>
>Test 133 of 194: Test _BTM (Battery Time).
>SKIPPED: Test 133, Skipping test for non-existent object _BTM.
>
>Test 134 of 194: Test _PCL (Power Consumer List).
>FAILED [CRITICAL] AETtype: Test 134, Detected error 'Type' when evaluating
>'\_SB_.ADP1._PCL'.
>
>ADVICE: The type of an object is incorrect and does not match the expected type.
>ACPI will generally abort execution of the AML op-code that causes this error.
>
>PASSED: Test 134, \_SB_.BAT0._PCL returned a sane package of 1 references.
>
>Test 135 of 194: Test _PIF (Power Source Information).
>SKIPPED: Test 135, Skipping test for non-existent object _PIF.
>
>Test 136 of 194: Test _PRL (Power Source Redundancy List).
>SKIPPED: Test 136, Skipping test for non-existent object _PRL.
>
>Test 137 of 194: Test _PSR (Power Source).
>PASSED: Test 137, \_SB_.ADP1._PSR correctly returned sane looking value
>0x00000000.
>
>Test 138 of 194: Test _GAI (Get Averaging Level).
>SKIPPED: Test 138, Skipping test for non-existent object _GAI.
>
>Test 139 of 194: Test _GHL (Get Harware Limit).
>SKIPPED: Test 139, Skipping test for non-existent object _GHL.
>
>Test 140 of 194: Test _PMC (Power Meter Capabilities).
>SKIPPED: Test 140, Skipping test for non-existent object _PMC.
>
>Test 141 of 194: Test _PMD (Power Meter Devices).
>SKIPPED: Test 141, Skipping test for non-existent object _PMD.
>
>Test 142 of 194: Test _PMM (Power Meter Measurement).
>SKIPPED: Test 142, Skipping test for non-existent object _PMM.
>
>Test 143 of 194: Test _WPC (Wireless Power Calibration).
>SKIPPED: Test 143, Skipping test for non-existent object _WPC.
>
>Test 144 of 194: Test _WPP (Wireless Power Polling).
>SKIPPED: Test 144, Skipping test for non-existent object _WPP.
>
>Test 145 of 194: Test _FIF (Fan Information).
>SKIPPED: Test 145, Skipping test for non-existent object _FIF.
>
>Test 146 of 194: Test _FPS (Fan Performance States).
>SKIPPED: Test 146, Skipping test for non-existent object _FPS.
>
>Test 147 of 194: Test _FSL (Fan Set Level).
>SKIPPED: Test 147, Skipping test for non-existent object _FSL.
>
>Test 148 of 194: Test _FST (Fan Status).
>SKIPPED: Test 148, Skipping test for non-existent object _FST.
>
>Test 149 of 194: Test _ACx (Active Cooling).
>SKIPPED: Test 149, Skipping test for non-existent object _AC0.
>
>SKIPPED: Test 149, Skipping test for non-existent object _AC1.
>
>SKIPPED: Test 149, Skipping test for non-existent object _AC2.
>
>SKIPPED: Test 149, Skipping test for non-existent object _AC3.
>
>SKIPPED: Test 149, Skipping test for non-existent object _AC4.
>
>SKIPPED: Test 149, Skipping test for non-existent object _AC5.
>
>SKIPPED: Test 149, Skipping test for non-existent object _AC6.
>
>SKIPPED: Test 149, Skipping test for non-existent object _AC7.
>
>SKIPPED: Test 149, Skipping test for non-existent object _AC8.
>
>SKIPPED: Test 149, Skipping test for non-existent object _AC9.
>
>
>Test 150 of 194: Test _ART (Active Cooling Relationship Table).
>SKIPPED: Test 150, Skipping test for non-existent object _ART.
>
>Test 151 of 194: Test _CRT (Critical Trip Point).
>SKIPPED: Test 151, Skipping test for non-existent object _CRT.
>
>Test 152 of 194: Test _CR3 (Warm/Standby Temperature).
>SKIPPED: Test 152, Skipping test for non-existent object _CR3.
>
>Test 153 of 194: Test _DTI (Device Temperature Indication).
>SKIPPED: Test 153, Skipping test for non-existent object _DTI.
>
>Test 154 of 194: Test _HOT (Hot Temperature).
>SKIPPED: Test 154, Skipping test for non-existent object _HOT.
>
>Test 155 of 194: Test _MTL (Minimum Throttle Limit).
>SKIPPED: Test 155, Skipping test for non-existent object _MTL.
>
>Test 156 of 194: Test _NTT (Notification Temp Threshold).
>SKIPPED: Test 156, Skipping test for non-existent object _NTT.
>
>Test 157 of 194: Test _PSL (Passive List).
>SKIPPED: Test 157, Skipping test for non-existent object _PSL.
>
>Test 158 of 194: Test _PSV (Passive Temp).
>SKIPPED: Test 158, Skipping test for non-existent object _PSV.
>
>Test 159 of 194: Test _RTV (Relative Temp Values).
>SKIPPED: Test 159, Skipping test for non-existent object _RTV.
>
>Test 160 of 194: Test _SCP (Set Cooling Policy).
>SKIPPED: Test 160, Skipping test for non-existent object _DTI.
>
>Test 161 of 194: Test _TC1 (Thermal Constant 1).
>SKIPPED: Test 161, Skipping test for non-existent object _TC1.
>
>Test 162 of 194: Test _TC2 (Thermal Constant 2).
>SKIPPED: Test 162, Skipping test for non-existent object _TC2.
>
>Test 163 of 194: Test _TFP (Thermal fast Sampling Period).
>SKIPPED: Test 163, Skipping test for non-existent object _TFP.
>
>Test 164 of 194: Test _TMP (Thermal Zone Current Temp).
>SKIPPED: Test 164, Skipping test for non-existent object _TMP.
>
>Test 165 of 194: Test _TPT (Trip Point Temperature).
>SKIPPED: Test 165, Skipping test for non-existent object _TPT.
>
>Test 166 of 194: Test _TRT (Thermal Relationship Table).
>SKIPPED: Test 166, Skipping test for non-existent object _TRT.
>
>Test 167 of 194: Test _TSN (Thermal Sensor Device).
>SKIPPED: Test 167, Skipping test for non-existent object _TSN.
>
>Test 168 of 194: Test _TSP (Thermal Sampling Period).
>SKIPPED: Test 168, Skipping test for non-existent object _TSP.
>
>Test 169 of 194: Test _TST (Temperature Sensor Threshold).
>SKIPPED: Test 169, Skipping test for non-existent object _TST.
>
>Test 170 of 194: Test _TZD (Thermal Zone Devices).
>SKIPPED: Test 170, Skipping test for non-existent object _TZD.
>
>Test 171 of 194: Test _TZM (Thermal Zone member).
>SKIPPED: Test 171, Skipping test for non-existent object _TZM.
>
>Test 172 of 194: Test _TZP (Thermal Zone Polling).
>SKIPPED: Test 172, Skipping test for non-existent object _TZP.
>
>Test 173 of 194: Test _GPE (General Purpose Events).
>PASSED: Test 173, \_SB_.PCI0.LPCB.EC__._GPE returned an integer 0x00000057
>
>Test 174 of 194: Test _EC_ (EC Offset Query).
>PASSED: Test 174, \_SB_.PCI0.LPCB.EC__.SMB0._EC_ correctly returned an integer.
>
>Test 175 of 194: Test _PTS (Prepare to Sleep).
>Test _PTS(3).
>PASSED: Test 175, \_PTS returned no values as expected.
>
>Test _PTS(4).
>PASSED: Test 175, \_PTS returned no values as expected.
>
>Test _PTS(5).
>PASSED: Test 175, \_PTS returned no values as expected.
>
>
>Test 176 of 194: Test _TTS (Transition to State).
>SKIPPED: Test 176, Optional control method _TTS does not exist.
>
>Test 177 of 194: Test _WAK (System Wake).
>Test _WAK(3) System Wake, State S3.
>PASSED: Test 177, \_WAK correctly returned a sane looking package.
>
>Test _WAK(4) System Wake, State S4.
>PASSED: Test 177, \_WAK correctly returned a sane looking package.
>
>Test _WAK(5) System Wake, State S5.
>PASSED: Test 177, \_WAK correctly returned a sane looking package.
>
>
>Test 178 of 194: Test _ADR (Return Unique ID for Device).
>PASSED: Test 178, \_SB_.PCI0._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.MCHC._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.MCH2._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.CMC2._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.LPCB._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.IMAP._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.SBUS._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.SBUS.BUS0._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.SBUS.BUS0.MKY0._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.SBUS.BUS1._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.NVPM._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC1._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC1.HUB1._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC1.HUB1.PRT1._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC1.HUB1.PRT2._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC1.HUB1.PRT3._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC1.HUB1.PRT4._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC1.HUB1.PRT5._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC1.HUB1.PRT6._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC1._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC1.HUB1._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC1.HUB1.PRT1._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC1.HUB1.PRT2._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC1.HUB1.PRT3._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC1.HUB1.PRT4._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC1.HUB1.PRT5._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC1.HUB1.PRT6._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC2._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC2.HUB1._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC2.HUB1.PRT2._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC2.HUB1.PRT3._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC2.HUB1.PRT4._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC2.HUB1.PRT5._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC2.HUB1.PRT6._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.OHC2.HUB1.PRT1._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC2._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC2.HUB1._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC2.HUB1.PRT2._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC2.HUB1.PRT3._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC2.HUB1.PRT4._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC2.HUB1.PRT5._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC2.HUB1.PRT6._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.EHC2.HUB1.PRT1._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.HDEF._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.SATA._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.SATA.PRT0._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.IXVE._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.IXVE.IGPU._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.IXVE.IGPU.LCD1._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.RP05._ADR correctly returned an integer.
>PASSED: Test 178, \_SB_.PCI0.RP05.ARPT._ADR correctly returned an integer.
>
>Test 179 of 194: Test _BCL (Query List of Brightness Control Levels Supported).
>Brightness levels for \_SB_.PCI0.IXVE.IGPU.LCD1._BCL:
>  Level on full power   : 80
>  Level on battery power: 50
>  Brightness Levels     : 0, 7, 13, 20, 27, 33, 40, 47, 53, 60, 67, 73, 80, 87, 93, 100
>PASSED: Test 179, \_SB_.PCI0.IXVE.IGPU.LCD1._BCL returned a sane package of 18
>integers.
>
>Test 180 of 194: Test _BCM (Set Brightness Level).
>SKIPPED: Test 180, Skipping test for non-existent object _BCM.
>
>Test 181 of 194: Test _BQC (Brightness Query Current Level).
>SKIPPED: Test 181, Skipping test for non-existent object _BQC.
>
>Test 182 of 194: Test _DCS (Return the Status of Output Device).
>SKIPPED: Test 182, Skipping test for non-existent object _DCS.
>
>Test 183 of 194: Test _DDC (Return the EDID for this Device).
>SKIPPED: Test 183, Skipping test for non-existent object _DDC.
>
>Test 184 of 194: Test _DSS (Device Set State).
>SKIPPED: Test 184, Skipping test for non-existent object _DSS.
>
>Test 185 of 194: Test _DGS (Query Graphics State).
>SKIPPED: Test 185, Skipping test for non-existent object _DGS.
>
>Test 186 of 194: Test _DOD (Enumerate All Devices Attached to Display Adapter).
>Device 0:
>  Video Chip Vendor Scheme 2147525664
>PASSED: Test 186, \_SB_.PCI0.IXVE.IGPU._DOD correctly returned a sane looking
>package.
>
>Test 187 of 194: Test _DOS (Enable/Disable Output Switching).
>SKIPPED: Test 187, Skipping test for non-existent object _DOS.
>
>Test 188 of 194: Test _GPD (Get POST Device).
>SKIPPED: Test 188, Skipping test for non-existent object _GPD.
>
>Test 189 of 194: Test _ROM (Get ROM Data).
>SKIPPED: Test 189, Skipping test for non-existent object _ROM.
>
>Test 190 of 194: Test _SPD (Set POST Device).
>SKIPPED: Test 190, Skipping test for non-existent object _SPD.
>
>Test 191 of 194: Test _VPO (Video POST Options).
>SKIPPED: Test 191, Skipping test for non-existent object _VPO.
>
>Test 192 of 194: Test _CBA (Configuration Base Address).
>SKIPPED: Test 192, Skipping test for non-existent object _CBA.
>
>Test 193 of 194: Test _IFT (IPMI Interface Type).
>SKIPPED: Test 193, Skipping test for non-existent object _IFT.
>
>Test 194 of 194: Test _SRV (IPMI Interface Revision).
>SKIPPED: Test 194, Skipping test for non-existent object _SRV.
>
>================================================================================
>341 passed, 6 failed, 0 warning, 0 aborted, 164 skipped, 0 info only.
>================================================================================
>
>
>341 passed, 6 failed, 0 warning, 0 aborted, 164 skipped, 0 info only.
>
>Test Failure Summary
>================================================================================
>
>Critical failures: 1
> method: Detected error 'Type' when evaluating '\_SB_.ADP1._PCL'.
>
>High failures: NONE
>
>Medium failures: 5
> method: \_SB_.PNLF._CID returned a string 'BACKLIGHT' but it was not a valid PNP ID or a valid ACPI ID.
> method: \_SB_.PCI0.LPCB.SMC_._CID returned a string 'SMC-MCP' but it was not a valid PNP ID or a valid ACPI ID.
> method: \_SB_.PCI0.SBUS.BUS0._CID returned a string 'SMBUS' but it was not a valid PNP ID or a valid ACPI ID.
> method: \_SB_.PCI0.SBUS.BUS0.MKY0._CID returned a string 'MIKEY' but it was not a valid PNP ID or a valid ACPI ID.
> method: \_SB_.PCI0.SBUS.BUS1._CID returned a string 'SMBUS' but it was not a valid PNP ID or a valid ACPI ID.
>
>Low failures: NONE
>
>Other failures: NONE
>
>Test           |Pass |Fail |Abort|Warn |Skip |Info |
>---------------+-----+-----+-----+-----+-----+-----+
>method         |  341|    6|     |     |  164|     |
>---------------+-----+-----+-----+-----+-----+-----+
>Total:         |  341|    6|    0|    0|  164|    0|
>---------------+-----+-----+-----+-----+-----+-----+

Actions: View

Attachments on bug 106869: 140104 | 140105 | 140106 | 140107 | 140108

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