Bug 104720 - Inhibit lid-based suspend during test suite runs
Summary: Inhibit lid-based suspend during test suite runs
Status: RESOLVED FIXED
Alias: None
Product: Wayland
Classification: Unclassified
Component: libinput (show other bugs)
Version: unspecified
Hardware: Other All
: medium normal
Assignee: Wayland bug list
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Reported: 2018-01-21 23:59 UTC by Peter Hutterer
Modified: 2018-02-21 03:53 UTC (History)
1 user (show)

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Attachments

Description Peter Hutterer 2018-01-21 23:59:03 UTC 
The test suite sends SW_LID events, causing the device to suspend (and tests to time out). This should be inhibited during test suite runs.
Comment 2 Peter Hutterer 2018-02-21 03:53:15 UTC 
commit 7175cafe78f19d5fbf025efd8e130e88eecb810c
Author: Peter Hutterer <peter.hutterer@who-t.net>
Date:   Thu Feb 1 14:23:41 2018 +1000

    test: inhibit nasty keys and switches during test runs

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